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conference paper
Novel Dynamic Scanning Microscope Probe and its Application to Local Electrical Measurement in an Ion Sensitive Field Effect Transistor
2004
Materials Research Society Symposium Fall Meeting
Type
conference paper
Author(s)
Date Issued
2004
Journal
Materials Research Society Symposium Fall Meeting
Start page
011.1.1
End page
011.1.6
Peer reviewed
NON-REVIEWED
Written at
OTHER
EPFL units
Available on Infoscience
May 12, 2009
Use this identifier to reference this record