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  4. The influence of Cr concentration on the phase composition and properties of a unidirectionally crystallized ternary system Cr-Fe-Si before and after annealing
 
research article

The influence of Cr concentration on the phase composition and properties of a unidirectionally crystallized ternary system Cr-Fe-Si before and after annealing

Suvorova, Elena
•
Ivanova, Anna
•
Arkharova, Natalya
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February 16, 2025
Crystallography Reports

This paper describes the phase composition, morphological, chemical, and crystallographic prop- erties of silicide phases in Cr–Fe–Si alloy ingots obtained through directional solidification, both before and after annealing. The samples had a general formula CrxFe Si 2 with x = 0.1, 0.2, 0.3, and 0.4. Characteriza- tion of samples using various techniques (powder X-ray diffraction, transmission and scanning electron microscopy with electron backscatter diffraction, energy dispersive X-ray spectroscopy) showed that the use of a higher Cr concentration (x = 0.3 and 0.4) leads to suppression of the formation of the ε-FeSi metallic cubic phase. The amount of Cr involved in the substitution of Fe in α-, β-, and ε-Fe silicides does not depend on the nominal Cr concentration introduced into initial melts. Unlike the samples that underwent the free crystallization process, neither pure Si nor some other silicides (for example, Cr5Si3 ) or pure Si were found in the ingots of directional crystallization. The orientation relationships between the phases and the directions of growth of precipitates before and after annealing were established. Electrical conductivity, Seebeck coeffi- cient and power factor were determined for the as grown and annealed ingots.

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Type
research article
DOI
10.1134/S1063774524602387
Author(s)
Suvorova, Elena
Ivanova, Anna
Arkharova, Natalya
Lukasov, Maxim
Fedor, Yu
Solomkin
Buffat, Philippe  

EPFL

Date Issued

2025-02-16

Publisher

Pleiades Publishing Ltd

Published in
Crystallography Reports
Volume

69

Issue

6

Start page

826

End page

837

Subjects

Cr-Fe-Si ternary system

•

directional solidification

•

phase transformation

•

transmission and scanning electron microscopy

•

electron backscatter diffraction

•

X-ray diffraction

•

thermoelectric

Note

This work is not exclusively the result of EPFL but rather a collaboration between multiple institutes.

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Available on Infoscience
February 17, 2026
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/247149
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