conference paper
Scratching and Brittle Fracture of Semiconductor In-Situ Scanning Electron Microscope
2006
Proc. of 16th European Conference on Fracture (ECF16)
Type
conference paper
Author(s)
Date Issued
2006
Published in
Proc. of 16th European Conference on Fracture (ECF16)
ISBN of the book
1-4020-4971-4
Note
IMT-NE Number: 435
Editorial or Peer reviewed
REVIEWED
Written at
OTHER
EPFL units
Available on Infoscience
February 10, 2009
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