Scratching and Brittle Fracture of Semiconductor In-Situ Scanning Electron Microscope

conference paper

Scratching and Brittle Fracture of Semiconductor In-Situ Scanning Electron Microscope

Wasmer, K.

•

Pouvreau, C.

•

2006

Proc. of 16th European Conference on Fracture (ECF16)

Name

preprint_435.pdf

Access type

openaccess

Size

1.06 MB

Format

Adobe PDF

Checksum (MD5)

1949564005cfaf61e9689e8b06062717