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conference paper
Scratching and Brittle Fracture of Semiconductor In-Situ Scanning Electron Microscope
2006
Proc. of 16th European Conference on Fracture (ECF16)
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Name
preprint_435.pdf
Access type
openaccess
Size
1.06 MB
Format
Adobe PDF
Checksum (MD5)
1949564005cfaf61e9689e8b06062717