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research article

Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes

Eckert, R.
•
Freyland, J. M.
•
Gersen, H.
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2000
Applied Physics Letters
  • Details
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Type
research article
DOI
10.1063/1.1330571
Author(s)
Eckert, R.
•
Freyland, J. M.
•
Gersen, H.
•
Heinzelmann, H.
•
Schürmann, G.
•
Noell, W.  
•
Staufer, U.
•
de Rooij, N. F.  
Date Issued

2000

Publisher

AIP American Institute of Physics

Published in
Applied Physics Letters
Volume

77

Start page

3695

End page

3697

Note

226

Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39229
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