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  4. Raman spectroscopy of sputtered AlN films: E-2(high) biaxial strain dependence
 
research article

Raman spectroscopy of sputtered AlN films: E-2(high) biaxial strain dependence

Trodahl, H. J.  
•
Martin, F.  
•
Muralt, P.  
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2006
Applied Physics Letters
  • Details
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Type
research article
DOI
10.1063/1.2335582
Web of Science ID

WOS:000239690800036

Author(s)
Trodahl, H. J.  
Martin, F.  
Muralt, P.  
Setter, N.  
Date Issued

2006

Published in
Applied Physics Letters
Volume

89

Issue

6

Article Number

061905

Note

061905

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LC  
Available on Infoscience
October 18, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/13099
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