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research article

Tracking deep-level defects in degrading perovskite solar cells with a multifactorial approach

Biaou, Carlos
•
Mcphail, Matthew
•
Eriguchi, Kazutaka
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July 1, 2024
Organic Electronics

In this work, we provide a mechanistic understanding of the degradation of perovskite solar cells in operation by focusing on methylammonium lead triiodide (CH3NH3PbI3 or MAPbI3) and tracking the evolution of electronic defects via photo-induced current transient spectroscopy (PICTS). Moreover, we also record the degradation of its photovaltaic characteristics over time under various electric load and temperature conditions. Using PICTS, we found that bands of trap states, initially highly localized deep within the band gap of the perovskite, widened over the exposure period. This effect was exacerbated with increasing temperature. Further, using the design of experiment methodology for this multifactorial study, we found that two interaction factors (temperaturex load & temperaturex time) were significant in the degradation of the perovskite cells, validating the importance of our holistic approach. Through these observations, we establish a mechanistic link between deep-level traps and photovoltaic characteristics.

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Type
research article
DOI
10.1016/j.orgel.2024.107074
Web of Science ID

WOS:001248277600001

Author(s)
Biaou, Carlos
Mcphail, Matthew
Eriguchi, Kazutaka
Subramanian, Vivek  
Dubon, Oscar
Date Issued

2024-07-01

Publisher

Elsevier

Published in
Organic Electronics
Volume

130

Article Number

107074

Subjects

Technology

•

Physical Sciences

•

Perovskite

•

Degradation

•

Photovoltaic

•

Multifactorial

•

Picts

•

Deep -Level Traps

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
IEM  
LAFT  
FunderGrant Number

National Science Foundation Graduate Research Fellowship

DGE1106400

Jack Kent Cooke Foundation

UC Berkeley Chancellor's Fellowship

Available on Infoscience
July 3, 2024
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/209084
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