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conference paper
A Physical Analysis of High Voltage MOSFET Capacitance Behaviour
2005
IEEE International Symposium on Industrial Electronics
Type
conference paper
Author(s)
Date Issued
2005
Published in
IEEE International Symposium on Industrial Electronics
Volume
2
Start page
473
End page
477
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
May 16, 2007
Use this identifier to reference this record