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research article

Glass-Forming Exogenous Silicon Contamination in Solid Oxide Fuel Cell Cathodes

Schuler, Josef Andreas  
•
Wuillemin, Zacharie  
•
Hessler, Aïcha  
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2011
Electrochemical and Solid State Letters

Spatially resolved analyses, by energy-dispersive X-ray spectroscopy (EDS) scanning electron microscopy (SEM), allowed the quantification of exogenous Si contamination in a solid oxide fuel cell (SOFC) cathode after operation. The Si quantification, taking into account the endogenous Si impurity level, correlated well with the expectation from the condensation of Si(OH)4 vapor, originating from upstream alloy components and saturated in the hot inlet air. At higher resolution, EDS-transmission electron microscopy (TEM) pointed out the deposition of Si vapor in the form of amorphous SiO2, blocking oxygen incorporation into the electrolyte phase within a composite SOFC cathode.

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Type
research article
DOI
10.1149/1.3516622
Author(s)
Schuler, Josef Andreas  
Wuillemin, Zacharie  
Hessler, Aïcha  
Van Herle, Jan  
Date Issued

2011

Publisher

Electrochemical Society

Published in
Electrochemical and Solid State Letters
Volume

14

Issue

2

Start page

B20

Subjects

Solid Oxide Fuel Cell (SOFC)

•

Cathode

•

Silicon

•

Yttria-Stabilized Zirconia

•

Water-Vapor

•

Oxidation Behavior

•

Sofc

•

Electrolytes

•

Conductivity

•

Steels

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LENI  
CIME  
Available on Infoscience
October 29, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/56298
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