In this paper, we validate the Verilog-A implementation of the nanowire ISFET model. Based on the developed code and EKV formalism, the flicker noise of the nanowire ISFET was studied. The Verilog-A code was validated by comparing the data obtained from the circuit simulator with corresponding data from COMSOL simulations. The good agreement between these simulations demonstrates the accuracy of the code and readout circuit. This noise analysis predicts the dependence of nanowire ISFET flicker noise on different system parameters. This approach is dedicated to assist designers in optimising the device before its implementation.