book part or chapter

Cathodoluminescence and transmission electron microscopy investigation of ZnCdSe/ZnSe electron-beam-pumped laser structures

Bonard, J. M.
•
Ganiere, J. D.  
•
Vanzetti, L.
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1995
Microscopy of Semiconducting Materials 1995

We present results obtained both with scanning electron microscopy (SEM) in the cathodoluminescence (CL) mode and transmission electron microscopy (TEM) on ZnCdSe/ZnSe electron-beam-pumped laser structures. This investigation aims at establishing a relationship between different parameters measurable in electron microscopy and the lasing activity of the structures.

Type
book part or chapter
Web of Science ID

WOS:A1995BE73Q00161

Author(s)
Bonard, J. M.
Ganiere, J. D.  
Vanzetti, L.
Sorba, L.
Franciosi, A.
Herve, D.
Molva, E.
Date Issued

1995

Publisher

Iop Publishing Ltd

Published in
Microscopy of Semiconducting Materials 1995
Start page

755

End page

758

Series title/Series vol.

Institute of Physics Conference Series

Volume
146
Note

Infm,lab tasc,i-34012 trieste,italy. cea technol avancees,leti,dept optr,f-38054 grenoble 9,france. Bonard, JM, ECOLE POLYTECH FED LAUSANNE,INST MICRO & OPTOELECTR,DEPT PHYS,CH-1015 LAUSANNE,SWITZERLAND.

ISI Document Delivery No.: BE73Q

Cited Reference Count: 5

Cited References:

BONARD JM, 1995, UNPUB

CHEN Y, 1994, APPL PHYS LETT, V65, P549

HERVE D, 1995, IN PRESS ELECTRON LE

JOUNEAU PH, 1993, THESIS I NATIONAL PO, P53

LOZYKOWSKI HJ, 1991, J APPL PHYS, V69, P3235

Article

TECHNO HOUSE, REDCLIFFE WAY, BRISTOL, ENGLAND BS1 6NX

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LOEQ  
Available on Infoscience
August 31, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/11175