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  4. Top-Down Design of a Low-Power Multi-Channel 2.5-Gbit/s/Channel Gated Oscillator Clock-Recovery Circuit
 
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conference paper

Top-Down Design of a Low-Power Multi-Channel 2.5-Gbit/s/Channel Gated Oscillator Clock-Recovery Circuit

Muller, Paul  
•
Tajalli, Armin  
•
Atarodi, Mojtaba
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2005
Proceedings of Design, Automation and Test in Europe (DATE)
Design, Automation and Test in Europe (DATE)

We present a complete top-down design of a low-power multi-channel clock recovery circuit based on gated current-controlled oscillators. The flow includes several tools and methods used to specify block constraints, to design and verify the topology down to the transistor level, as well as to achieve a power consumption as low as 5mW/Gbit/s. Statistical simulation is used to estimate the achievable bit error rate in presence of phase and frequency errors and to prove the feasibility of the concept. VHDL modeling provides extensive verification of the topology. Thermal noise modeling based on well-known concepts delivers design parameters for the device sizing and biasing. We present two practical examples of possible design improvements analyzed and implemented with this methodology.

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Type
conference paper
DOI
10.1109/DATE.2005.315
Web of Science ID

WOS:000228086900048

Author(s)
Muller, Paul  
•
Tajalli, Armin  
•
Atarodi, Mojtaba
•
Leblebici, Yusuf  
Date Issued

2005

Publisher

IEEE

Published in
Proceedings of Design, Automation and Test in Europe (DATE)
Volume

1

Start page

258

End page

263

Subjects

integrated circuit design

•

clock recovery

•

top-down design

•

design methodology

•

low-power design

•

gated oscillator

•

CDR

Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSM  
Event nameEvent placeEvent date
Design, Automation and Test in Europe (DATE)

Munich, Germany

March 7-11

Available on Infoscience
October 10, 2005
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/217202
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