sample holder for low-temperature insitu deformation tests in 200 kv transmission electron-microscope

research article

GOTTHARDT, R

•

BUFFAT, P

1979

Name

Helvetica_Physica_Acta_FSPG_1979_52_30.pdf

Type

Publisher's Version

Version

http://purl.org/coar/version/c_970fb48d4fbd8a85

Access type

openaccess

Size

1.05 MB

Format

Adobe PDF

Checksum (MD5)

35d582c9bff0f920e733587b2625a513