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  4. Two signal method of measuring large signal S-parameters of transistors
 
conference paper

Two signal method of measuring large signal S-parameters of transistors

Mazumder, S.
•
Van de Puije, P.
1978
MTT-S International Microwave Symposium
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Type
conference paper
Author(s)
Mazumder, S.
Van de Puije, P.
Date Issued

1978

Published in
MTT-S International Microwave Symposium
Start page

263

End page

266

Written at

EPFL

EPFL units
LEMA  
Event place
Available on Infoscience
November 30, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/236198
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