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research article

Strong ferroelectric domain-wall pinning in BiFeO3 ceramics

Rojac, Tadej
•
Kosec, Marija
•
Budic, Bojan
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2010
Journal of Applied Physics

We have studied the polarization-electric-field hysteresis, the dielectric permittivity dispersion, the piezoelectric properties, the electric-field-induced strain, and the interrelations between these properties for bismuth ferrite (BiFeO3) ceramics. The results indicate that the domain-wall movement in BiFeO3 is strongly inhibited by charged defects, most probably acceptor-oxygen-vacancy defect pairs. The domain-wall mobility can be considerably increased by preventing the defects from migrating into their stable configuration; this can be achieved by thermal quenching from above the Curie temperature, which freezes the disordered defect state. Similarly, Bi2O3 loss during annealing at high temperatures contributes to depinning of the domain walls and an increase in the remanent polarization. The possible defects causing the pinning effect are analyzed and discussed. A weakening of the contacts between the grains in the ceramics and crack propagation were observed during poling with constant field at 100 kV/cm. This is probably caused by an electrically induced strain associated with ferroelastic domain reversal. A relatively large piezoelectric d33 constant of 44 pC/N was obtained by “cyclic poling,” in which the electric field was released after each applied cycle with the purpose to relax the mechanical stresses and minimize the problem of cracking.

  • Details
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Type
research article
DOI
10.1063/1.3490249
Web of Science ID

WOS:000283222200106

Author(s)
Rojac, Tadej
Kosec, Marija
Budic, Bojan
Setter, Nava  
Damjanovic, Dragan  
Date Issued

2010

Publisher

American Institute of Physics

Published in
Journal of Applied Physics
Volume

108

Issue

7

Article Number

074107

Subjects

annealing

•

vacancies (crystal)

•

bismuth compounds

•

Curie temperature

•

dielectric hysteresis

•

dielectric polarization

•

electric domains

•

ferroelectric ceramics

URL

URL

http://jap.aip.org/resource/1/japiau/v108/i7/p074107_s1
Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LC  
Available on Infoscience
October 8, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/55314
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