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  4. Advanced optical characterization of micro solid immersion lens
 
conference paper

Advanced optical characterization of micro solid immersion lens

Kim, Myun-Sik  
•
Scharf, Toralf  
•
Brun, Mickael
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2012
Optical Micro- And Nanometrology Iv
Conference on Optical Micro- and Nanometrology IV

We report on the advanced optical characterizations of microfabricated solid immersion lenses with 2-mu m diameter, operating at lambda = 642 nm. The main feature, the spot size reduction, has been investigated by applying a focused Gaussian beam of NA = 0.9. Particular illuminating beams, e. g., Bessel-Gauss beams of the zeroth and the first order, a doughnut-shape beam and its decompositions, i.e. two-half-lobes beams, have also been used to influence the shape of the immersed focal spot. Detailed optical characterizations have been conducted by measuring the amplitude and phase distributions with a high-resolution interference microscope (HRIM) in volume around the focal spot. The immersion effect of the SiO2 solid immersion lens leads to a spot-size reduction of approximately 1.5 which agrees well with theory. Particularly shaped incident beams exhibit a comparable size reduction of the immersed spots. Such structured focal spots are of significant interest in optical trapping, lithography, and optical data storage systems.

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Type
conference paper
DOI
10.1117/12.921871
Web of Science ID

WOS:000305704500012

Author(s)
Kim, Myun-Sik  
Scharf, Toralf  
Brun, Mickael
Olivier, Segolene
Nicoletti, Sergio
Herzig, Hans Peter  
Date Issued

2012

Publisher

Spie-Int Soc Optical Engineering, Po Box 10, Bellingham, Wa 98227-0010 Usa

Published in
Optical Micro- And Nanometrology Iv
ISBN of the book

978-0-8194-9122-0

Series title/Series vol.

Proceedings of SPIE; 8430

Start page

84300E

Subjects

Solid immersion lens (SIL)

•

illumination engineering

•

beam shaping

•

azimuthal polarization

•

Bessel-Gauss beam

•

Laguerre-Gaussian beam

•

doughnut beam

•

high-resolution interference microscope (HRIM)

•

Resolution Interference Microscopy

•

Order Bessel Beams

•

Bottle Beam

•

Interferometry

•

Scale

•

Manipulation

•

Particles

•

Systems

•

Light

•

Field

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
IMT  
Event nameEvent placeEvent date
Conference on Optical Micro- and Nanometrology IV

Brussels, BELGIUM

Apr 16-18, 2012

Available on Infoscience
July 20, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/84032
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