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  4. Pin-shape assessment for interlayer-cooled chip stacks with periodic boundary condition modeling
 
conference paper

Pin-shape assessment for interlayer-cooled chip stacks with periodic boundary condition modeling

Töral, Gözde
•
Bender, R.
•
Leblebici, Yusuf  
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2010
Proceedings of the 16th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
16th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
  • Details
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Type
conference paper
Author(s)
Töral, Gözde
Bender, R.
Leblebici, Yusuf  
Brunschwiler, T.
Date Issued

2010

Published in
Proceedings of the 16th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
Start page

1

End page

10

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSM  
Event nameEvent placeEvent date
16th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)

Barcelona, Spain

October 6-8

Available on Infoscience
April 7, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/66040
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