Reliable Gate Driving of SiC MOSFETs With Crosstalk Voltage Elimination and Two-Step Short-Circuit Protection

research article

Reliable Gate Driving of SiC MOSFETs With Crosstalk Voltage Elimination and Two-Step Short-Circuit Protection

Li, Chengmin

•

Sheng, Jing

•

2022

IEEE Transactions on Industrial Electronics

Name

2022_IEEE_TIE_Li.pdf

Type

postprint

Access type

openaccess

License Condition

n/a

Size

6.3 MB

Format

Adobe PDF

Checksum (MD5)

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