conference paper not in proceedings
Fluctuation Scaling in Nano-Interconnects and its Application to Electromigration
Beyne, Sofie
•
Beyne, Tim
2019
Type
conference paper not in proceedings
Author(s)
Beyne, Sofie
Beyne, Tim
Editors
Date Issued
2019
Publisher
Editorial or Peer reviewed
REVIEWED
Written at
OTHER
EPFL units
| Event name | Event place | Event date |
EPFL Neuchâtel campus - Neuchâtel, Switzerland | 18 - 21 June 2019 | |
Available on Infoscience
August 22, 2019
Use this identifier to reference this record