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research article
Dark-field optical coherence microscopy
2010
Dark-field illumination is known to enhance scattering contrast in optical microscopy. We combined this concept with Fourier domain optical coherence microscopy (OCM). The detection and illumination paths are decoupled, and only the scattered light originating from the sample generates the tomogram signal, whereas any specular reflection is highly suppressed. We analyze and discuss this dark-field OCM concept and present its superior imaging quality on live cell samples.
Type
research article
Web of Science ID
WOS:000283048100061
Authors
Publication date
2010
Publisher
Published in
Volume
35
Issue
20
Start page
3489
End page
3491
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
April 14, 2011
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