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Ab initio calculations of the structural, electronic and dynamical properties of high-kappa dielectrics

Rignanese, G. M.
•
Gonze, X.
•
Pasquarello, Alfredo  orcid-logo
2004
High-K Gate Dielectrics
  • Details
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Type
book part or chapter
Author(s)
Rignanese, G. M.
Gonze, X.
Pasquarello, Alfredo  orcid-logo
Date Issued

2004

Publisher

CRC Press

Published in
High-K Gate Dielectrics
Start page

431

End page

466

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CSEA  
Available on Infoscience
October 8, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/43471
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