conference paper
Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth
2009
Proceedings of the 4th International Conference on Nano-Nets (Nano-Net)
Type
conference paper
Author(s)
Date Issued
2009
Published in
Proceedings of the 4th International Conference on Nano-Nets (Nano-Net)
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Lucerne, Switzerland | October 18-20, 2009 | |
Available on Infoscience
November 19, 2009
Use this identifier to reference this record