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conference paper
Hot carrier degradation of lateral DMOS transistor capacitance and reliability issues
2005
Proceedings of 43rd Annual IEEE International Reliability Physics Symposium
Type
conference paper
Authors
Publication date
2005
Published in
Proceedings of 43rd Annual IEEE International Reliability Physics Symposium
Start page
551
End page
554
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
May 16, 2007
Use this identifier to reference this record