Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Higher-Order Riesz Transforms And Steerable Wavelet Frames
 
conference paper

Higher-Order Riesz Transforms And Steerable Wavelet Frames

Unser, Michael  
•
Van De Ville, Dimitri  
2009
2009 16Th Ieee International Conference On Image Processing
16th IEEE International Conference on Image Processing

We introduce an Nth-order extension of the Riesz transform in d dimensions. We prove that this generalized transform has the following remarkable properties: shift-invariance, scale-invariance, inner-product preservation, and steerability. The pleasing consequence is that the transform maps any primary wavelet frame (or basis) of L-2(R-d) into another "steerable" wavelet frame, while preserving the frame bounds. The concept provides a rigorous functional counterpart to Simoncelli's steerable pyramid whose construction was entirely based on digital filter design. The proposed mechanism allows for the specification of wavelets with any order of steerability in any number of dimensions; it also yields a perfect reconstruction filter-bank algorithm. We illustrate the method using a Mexican-hat-like polyharmonic spline wavelet transform as our primary frame.

  • Details
  • Metrics
Type
conference paper
DOI
10.1109/ICIP.2009.5414300
Web of Science ID

WOS:000280464301396

Author(s)
Unser, Michael  
Van De Ville, Dimitri  
Date Issued

2009

Publisher

Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa

Published in
2009 16Th Ieee International Conference On Image Processing
Start page

3757

End page

3760

Subjects

wavelet transform

•

steerable filters

•

frames

•

multiresolution analysis

URL

URL

http://bigwww.epfl.ch/publications/unser0908.html

URL

http://bigwww.epfl.ch/publications/unser0908.pdf

URL

http://bigwww.epfl.ch/publications/unser0908.ps
Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
MIPLAB  
LIB  
Event nameEvent placeEvent date
16th IEEE International Conference on Image Processing

Cairo, EGYPT

Nov 07-10, 2009

Available on Infoscience
November 30, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/59357
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés