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  4. Development of a diagnosis tool based on the measurement of molecular interactions using CMOS-integrated piezoresistive microcantilevers
 
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conference paper

Development of a diagnosis tool based on the measurement of molecular interactions using CMOS-integrated piezoresistive microcantilevers

Bausells, J.
•
Villanueva, G.  
•
Perez-Murano, F.
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2006
3rd International Workshop on Nanomechanical Sensors (NMC)
3rd International Workshop on Nanomechanical Sensors (NMC)
  • Details
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Type
conference paper
Author(s)
Bausells, J.
•
Villanueva, G.  
•
Perez-Murano, F.
•
Lichtenberg, J.
•
Zimmermann, M.
•
Volden, T.
Date Issued

2006

Published in
3rd International Workshop on Nanomechanical Sensors (NMC)
Start page

212

End page

215

Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
NEMS  
Event nameEvent placeEvent date
3rd International Workshop on Nanomechanical Sensors (NMC)

Copenhagen, Denmark

2006

Available on Infoscience
August 6, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/93787
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