Investigation of the Electric-Field Profile in Microcrystalline Silicon p-i-n Solar Cells by Cross-Sectional Scanning Kelvin Probe Microscopy

Dominé, D.; Bailat, J.; Python, M.; Wyrsch, N.; Ballif, C.; Moutinho, H. R.; Jiang, C.-S.; Al-Jassim, M. M.

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conference paper not in proceedings

Investigation of the Electric-Field Profile in Microcrystalline Silicon p-i-n Solar Cells by Cross-Sectional Scanning Kelvin Probe Microscopy

Dominé, D.

•

Bailat, J.

•

Python, M.

2007

Name

preprint_470.pdf

Access type

openaccess

Size

491.12 KB

Format

Adobe PDF

Checksum (MD5)

a9168df335ed7d9cca760f829d738e4b