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research article
New Method for Threshold Voltage Extraction of High Voltage MOSFETs based on Gate-to-Drain Capacitance Measurement
Type
research article
Web of Science ID
WOS:000238712200024
Authors
Anghel, C.
•
Bakeroot, B.
•
•
Gillon, R.
•
Maier, C.
•
Moens, P.
•
Doutreloigne, J.
•
Publication date
2006
Published in
Volume
27
Issue
7
Start page
602
End page
604
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
May 16, 2007
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