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research article

Analysis of Error Recovery Schemes for Networks on Chips

Murali, Srinivasan  
•
Benini, Luca  
•
Theocharides, Theocharis
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2005
IEEE Design & Test of Computers

In this article, we discuss design constraints to characterize efficient error recovery mechanisms for the NoC design environment. We explore error control mechanisms at the data link and network layers and present the schemes' architectural details. We investigate the energy efficiency, error protection efficiency, and performance impact of various error recovery mechanisms.

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Type
research article
DOI
10.1109/MDT.2005.104
Web of Science ID

WOS:000231826100008

Author(s)
Murali, Srinivasan  
Benini, Luca  
Theocharides, Theocharis
Vijaykrishnan, N.
Irwin, Mary Jane
De Micheli, Giovanni  
Date Issued

2005

Publisher

Institute of Electrical and Electronics Engineers

Published in
IEEE Design & Test of Computers
Volume

22

Issue

5

Start page

434

End page

442

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LSI1  
Available on Infoscience
November 7, 2005
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/219428
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