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  4. A Deep-Learning Approach to Side-Channel Based CPU Disassembly at Design Time
 
conference paper

A Deep-Learning Approach to Side-Channel Based CPU Disassembly at Design Time

Fendri, Hedi
•
Macchetti, Marco
•
Perrine, Jérôme
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March 22, 2022
Proceedings Of The 2022 Design, Automation & Test In Europe Conference & Exhibition (DATE 2022)
25th Design, Automation and Test in Europe Conference and Exhibition (DATE)

Side-channel CPU disassembly is a side-channel attack that allows an adversary to recover instructions executed by a processor. Not only does such an attack compromise code confidentiality, it can also reveal critical information on the system’s internals. Being easily accessible to a vast number of end users, modern embedded devices are highly vulnerable against disassembly attacks. To protect them, designers deploy countermeasures and verify their efficiency in security laboratories. Clearly, any vulnerability discovered at that point, after the integrated circuit has been manufactured, represents an important setback. In this paper, we address the above issues in two steps: Firstly, we design a framework that takes a design netlist and outputs simulated power side-channel traces, with the goal of assessing the vulnerability of the device at design time. Secondly, we propose a novel side-channel disassembler, based on multilayer perceptron and sparse dictionary learning for feature engineering. Experimental results on simulated and measured side-channel traces of two commercial RISC-V devices, both working on operating frequencies of at least 100 MHz, demonstrate that our disassembler can recognize CPU instructions with success rates of 96.01% and 93.16%, respectively.

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Type
conference paper
DOI
10.23919/DATE54114.2022.9774531
Web of Science ID

WOS:000819484300130

Author(s)
Fendri, Hedi
Macchetti, Marco
Perrine, Jérôme
Stojilovic, Mirjana  
Date Issued

2022-03-22

Publisher

IEEE

Published in
Proceedings Of The 2022 Design, Automation & Test In Europe Conference & Exhibition (DATE 2022)
ISBN of the book

978-3-9819263-6-1

Total of pages

6

Series title/Series vol.

Design Automation and Test in Europe Conference and Exhibition

Start page

670

End page

675

Subjects

Disassembly

•

Deep learning

•

Design time

•

Embedded processors

•

Power side-channel

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
PARSA  
Event nameEvent placeEvent date
25th Design, Automation and Test in Europe Conference and Exhibition (DATE)

Antwerp, Belgium [Virtual]

March 14-23, 2022

Available on Infoscience
January 24, 2022
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/184729
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