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  4. Ambipolar Gate-Controllable SiNW FETs for Configurable Logic Circuits With Improved Expressive Capability
 
research article

Ambipolar Gate-Controllable SiNW FETs for Configurable Logic Circuits With Improved Expressive Capability

Sacchetto, Davide  
•
De Micheli, Giovanni  
•
Leblebici, Yusuf  
2012
IEEE Electron Device Letters

In this letter, we report on the fabrication and characterization of ambipolar silicon-nanowire (SiNW) field-effect transistors (FETs) with a double-independent-gate (DIG) structure for polarity control. Several structures are fabricated, showing the effectiveness of local back gate to enable switchable ambipolar functionality. Moreover, and, nand, nor, xor, and xnor binary logic functions can be obtained with a single gate, depending on the encoding values used for the input signals. Repeatable behaviors of DIG SiNW FETs are considered as enablers for ambipolar-controlled logic, with all the benefits related to the maturity of the silicon technology.

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Type
research article
DOI
10.1109/LED.2011.2174410
Web of Science ID

WOS:000299812300005

Author(s)
Sacchetto, Davide  
De Micheli, Giovanni  
Leblebici, Yusuf  
Date Issued

2012

Publisher

Institute of Electrical and Electronics Engineers

Published in
IEEE Electron Device Letters
Volume

33

Issue

2

Start page

143

End page

145

Subjects

Ambipolar control

•

field-effect transistor (FET)

•

nanowire

•

Schottky barrier

•

Transistors

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSM  
LSI1  
Available on Infoscience
December 22, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/75971
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