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research article

Data acquisition system for high speed atomic force microscopy

Fantner, G. E.  
•
Hegarty, P.
•
Kindt, J. H.
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2005
Review of Scientific Instruments

With the development of atomic force microscopes that allow higher scan speeds, the need for data acquisition systems (DAQ) that are capable of handling the increased amounts of data in real time arises. We have developed a low cost data acquisition and scan control system around a commercially available DAQ board in a WINDOWS environment. By minimizing the involvement of the processor in the data transfer using direct memory access, and generation of the scan signals synchronously with the data acquisition, we were able to record 30 frames per second with a pixel resolution of 150x150 pixels and 14 bit per channel. (C) 2005 American Institute of Physics.

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Type
research article
DOI
10.1063/1.1850651
Web of Science ID

WOS:000226738400086

Author(s)
Fantner, G. E.  
Hegarty, P.
Kindt, J. H.
Schitter, G.
Cidade, G. A. G.
Hansma, P. K.
Date Issued

2005

Published in
Review of Scientific Instruments
Volume

76

Issue

2

Article Number

026118

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LBNI  
Available on Infoscience
November 5, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/56748
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