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research article
Wafer- and piece-wise Si tip transfer technologies for applications in scanning probe microscopy
Type
research article
Author(s)
Date Issued
1999
Published in
Volume
8
Issue
1
Start page
65
End page
70
Note
211
Peer reviewed
REVIEWED
Written at
OTHER
EPFL units
Available on Infoscience
May 12, 2009
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