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  4. Epitaxial Lead Chalcogenides on Si for Mid-IR Detectors and Emitters Including Cavities
 
research article

Epitaxial Lead Chalcogenides on Si for Mid-IR Detectors and Emitters Including Cavities

Zogg, H.
•
Arnold, M.
•
Felder, F.
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2008
Journal of Electronic Materials

Lead chalcogenide (IV-VI narrow-gap semiconductor) layers on Si or BaF2(111) substrates are employed to realize two mid-infrared optoelectronic devices for the first time. A tunable resonant cavity enhanced detector is realized by employing a movable mirror. Tuning is across the 4 μm to 5.5 μm wavelength range, and linewidth is <0.1 μm. Due to the thin (0.3 μm) PbTe photodiode inside the cavity, a higher sensitivity at higher operating temperatures was achieved as compared to conventional thick photodiodes. The second device is an optically pumped vertical external-cavity surface-emitting laser with PbTe-based gain layers. It emits at ~5 μm wavelength and with output power up to 50 mW pulsed, or 3 mW continuous wave at 100 K.

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Type
research article
DOI
10.1007/s11664-008-0429-0
Author(s)
Zogg, H.
Arnold, M.
Felder, F.
Rahim, M.
Ebneter, C.
Zasavitskiy, I.
Quack, Niels  
Blunier, S.
Dual, J.
Date Issued

2008

Published in
Journal of Electronic Materials
Volume

37

Issue

9

Start page

1497

End page

1503

Subjects

Characterization and Evaluation of Materials

•

Electronics and Microelectronics

•

Instrumentation

•

Mid-infrared optoelectronic devices

•

Optical and Electronic Materials

•

RCED

•

Solid State Physics and Spectroscopy

•

VECSEL

•

epitaxy

•

lead chalcogenides

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
GR-QUA  
Available on Infoscience
July 7, 2015
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/115911
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