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conference paper
Characterization by transmission electron microscopy of gradients in the chemical composition of GaAs/Al/sub x/Ga/sub 1-x/As semiconductor laser structures
1995
3rd Int. Symposium on Structural and Functional Gradient Materials.
Type
conference paper
Author(s)
Date Issued
1995
Journal
3rd Int. Symposium on Structural and Functional Gradient Materials.
Volume
xx-731
Start page
371
End page
376
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
February 15, 2007
Use this identifier to reference this record