conference paper
Atomic structure at the CoSi2/Si<111>interface
1989
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference
Type
conference paper
Author(s)
Date Issued
1989
Publisher
Published in
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference
Volume
100
Issue
8
Start page
621
End page
626
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
February 15, 2007
Use this identifier to reference this record