Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures
 
conference paper

Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures

't Hart, P. A.
•
Babaie, M.
•
Charbon, E.  
Show more
January 1, 2019
49Th European Solid-State Device Research Conference (Essderc 2019)
49th European Solid-State Device Research Conference (ESSDERC)

Cryogenic device models are essential for the reliable design of the cryo-CMOS interface that enables large-scale quantum computers. In this paper, mismatch characterization and modeling of a 40-nm bulk CMOS process over the 4.2-300 K temperature range is studied, towards an all-operating-region mismatch model. An overall increase of variability is shown, in particular in the subthreshold region at cryogenic temperatures due to a dramatic increase of the subthreshold slope mismatch. Mismatch in strong inversion is modeled by the Croon model while the weak-inversion region is modeled by taking subthreshold slope variability into account. This results in the first model capable of predicting mismatch over the whole range of operating regions and temperatures.

  • Details
  • Metrics
Type
conference paper
DOI
10.1109/ESSDERC.2019.8901745
Web of Science ID

WOS:000520409500025

Author(s)
't Hart, P. A.
Babaie, M.
Charbon, E.  
Vladimirescu, A.
Sebastiano, F.
Date Issued

2019-01-01

Publisher

IEEE

Publisher place

New York

Published in
49Th European Solid-State Device Research Conference (Essderc 2019)
ISBN of the book

978-1-7281-1539-9

Series title/Series vol.

Proceedings of the European Solid-State Device Research Conference

Start page

98

End page

101

Subjects

Engineering, Electrical & Electronic

•

Engineering

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
AQUA  
Event nameEvent placeEvent date
49th European Solid-State Device Research Conference (ESSDERC)

Cracow, POLAND

Sep 23-26, 2019

Available on Infoscience
April 8, 2020
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/168037
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés