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  4. Characterization of Semiconductor Interfaces with Synchrotron Radiation
 
research article

Characterization of Semiconductor Interfaces with Synchrotron Radiation

Margaritondo, G.  
1987
Superlattices and Microstructures
  • Details
  • Metrics
Type
research article
DOI
10.1016/0749-6036(87)90204-7
Author(s)
Margaritondo, G.  
Date Issued

1987

Published in
Superlattices and Microstructures
Volume

3

Issue

4

Start page

341

End page

345

Note

Univ wisconsin,ctr synchrotron radiat,madison,wi 53706. Margaritondo, g, univ wisconsin,dept phys,madison,wi 53706.

ISI Document Delivery No.: L5353

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSE  
LPRX  
Available on Infoscience
October 3, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/234421
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