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conference paper not in proceedings

Trace gas measurement using IR laser diodes

Schilt, Stéphane
•
Thévenaz, Luc  
•
Robert, Philippe
2000
Trends in Optical Non-destructive Testing

The properties of semiconductor laser diodes for trace gas measurements are reviewed. First, the modulation characteristics of these lasers are discussed. Then, two sensitive spectroscopic methods using a frequency-modulated near-IR laser are presented and their performance compared. In the λ = 2 μm range, second-harmonic optical detection has shown a 20 times better detection limit than photoacoustic detection. The extension of these methods to longer wavelengths is finally discussed.

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Type
conference paper not in proceedings
Author(s)
Schilt, Stéphane
Thévenaz, Luc  
Robert, Philippe
Date Issued

2000

Subjects

laser diode

•

spectroscopy

•

wavelength modulation spectroscopy

•

photoacoustic spectroscopy

•

gas sensing

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
SCI-STI-LT  
THEVE  
Event nameEvent placeEvent date
Trends in Optical Non-destructive Testing

Lugano, Switzerland

June 3-5, 2000

Available on Infoscience
March 9, 2017
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/135152
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