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conference paper
CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity
January 1, 2018
2018 76Th Device Research Conference (Drc)
Type
conference paper
Web of Science ID
WOS:000444728400053
Authors
Zhang, Jun-Rui
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Cordero, E. Garcia
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Ebejer, N.
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Publication date
2018-01-01
Publisher
Publisher place
New York
Published in
2018 76Th Device Research Conference (Drc)
ISBN of the book
978-1-5386-3028-0
Series title/Series vol.
IEEE Device Research Conference Proceedings
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Santa Barbara, CA | Jun 24-27, 2018 | |
Available on Infoscience
December 13, 2018
Use this identifier to reference this record