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  4. Comparison of Different Precision Pseudo Resistor Realizations in the DC-Feedback of Capacitive Transimpedance Amplifiers
 
conference paper

Comparison of Different Precision Pseudo Resistor Realizations in the DC-Feedback of Capacitive Transimpedance Amplifiers

Haeberle, Matthias
•
Djekic, Denis
•
Rajabzadeh, Mahdi
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January 1, 2019
2019 26Th Ieee International Conference On Electronics, Circuits And Systems (Icecs)
26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

In this paper, three different pseudo resistor (PR) realizations are compared regarding their noise and linearity performance within the DC feedback loop of an integrator-differentiator transimpedance amplifier (I-D-TIA). Thanks to its intrinsic shot noise suppression, the multi-element pseudo resistor (MEPR) shows the best SNDR for small AC signals around a large DC current. In contrast, for large AC signals around comparably small DC currents, the transconductor based PR introduced by Ferrari et al. in [1] displays a rail-to-rail signal swing capability and a small THD of 0.4% resulting in the best achievable SNDR value. All simulations have been performed on transistor level in a 180nm SOI CMOS technology with a 1.8V supply.

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Type
conference paper
DOI
10.1109/ICECS46596.2019.8965196
Web of Science ID

WOS:000534573400184

Author(s)
Haeberle, Matthias
Djekic, Denis
Rajabzadeh, Mahdi
Fantner, Georg E.  
Lips, Klaus
Ortmanns, Maurits
Anders, Jens
Date Issued

2019-01-01

Publisher

IEEE

Publisher place

New York

Published in
2019 26Th Ieee International Conference On Electronics, Circuits And Systems (Icecs)
ISBN of the book

978-1-7281-0996-1

Series title/Series vol.

IEEE International Conference on Electronics Circuits and Systems

Start page

699

End page

702

Subjects

Engineering, Electrical & Electronic

•

Engineering

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LBNI  
Event nameEvent placeEvent date
26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

Genoa, ITALY

Nov 27-29, 2019

Available on Infoscience
June 30, 2020
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/169705
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