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research article
Experimental study of the process dependence of Mo, Cr, Ti, and W silicon Schottky diodes and contact resistance
Type
research article
Web of Science ID
WOS:000236473500018
Authors
Publication date
2006
Published in
Volume
53
Issue
4
Start page
712
End page
718
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
May 16, 2007
Use this identifier to reference this record