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  4. Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
 
research article

Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing

Auchlin, Maxime  
•
Marozau, Ivan
•
Bayat, Dara Z.
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November 1, 2020
Microelectronics Reliability

Commercial Off-The-Shelf (COTS) automotive inertial measurement units were subjected to severe accumulative stress conditions: thermal shocks (high temperature gradients), temperature cycling (low gradients) and mechanical vibration are combined in an A-then-B sequential testing procedure, with the aim to promote failure acceleration and improve lifetime prediction. The maximum stresses, applied individually, did not cause failure on the selected components. On the other hand, accumulative bi-parameter testing conditions resulted in die attach delamination. Three batches of devices tested with different preconditioning (A-then-B or B-then-A) display different reliability figures. Failure mode and effects analysis (FMEA) is established. A Finite Element Analysis (FEA) is done based on a destructive physical analysis of the devices to confirm the correlation between the stresses applied and the physics of the failure in order to understand the thermomechanical behavior of the devices, linking it to observed failures.

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Type
research article
DOI
10.1016/j.microrel.2020.113913
Web of Science ID

WOS:000593986100011

Author(s)
Auchlin, Maxime  
Marozau, Ivan
Bayat, Dara Z.
Marchand, Laurent
Gass, Volker  
Sereda, Olha
Date Issued

2020-11-01

Publisher

PERGAMON-ELSEVIER SCIENCE LTD

Published in
Microelectronics Reliability
Volume

114

Article Number

113913

Subjects

Engineering, Electrical & Electronic

•

Nanoscience & Nanotechnology

•

Physics, Applied

•

Engineering

•

Science & Technology - Other Topics

•

Physics

•

conductive adhesive joints

•

fatigue

•

temperature

•

reliability

•

behavior

•

model

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CTS  
Available on Infoscience
December 30, 2020
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/174358
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