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conference paper

A High Fault-Coverage Design-for-Testability Approach for a MIMD Based Multimedia Processor

Gumm, M.
•
Brocci, M.
•
Mombers, F.
1997
European Design & Test Conference and Exhibition, Paris La Defense
Type
conference paper
Authors
Gumm, M.
•
Brocci, M.
•
Mombers, F.
Publication date

1997

Publisher

IEEE

Published in
European Design & Test Conference and Exhibition, Paris La Defense
Publisher place

Berlin

Subjects

LTS3

Databases and Informa...

EPFL units
LTS 
SCI-STI-MM 
Available on Infoscience
June 14, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/230936