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  4. Thickness Dependence of Domain-Wall Patterns in BiFeO3 Thin Films
 
research article

Thickness Dependence of Domain-Wall Patterns in BiFeO3 Thin Films

Crassous, A.
•
Sluka, T.  
•
Sandu, C. S.
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2015
Ferroelectrics

Unique properties of domain walls in ferroelectrics have been recently discovered but methods of their controlled engineering remain underdeveloped. Here we investigate the domain structure of Bi0.9La0.1FeO3 epitaxial thin films with piezoelectric force microscopy and transmission electron microscopy. We show that with increasing Bi0.9La0.1FeO3 thickness, a transition from randomly-oriented 71 degrees domain walls to 109 degrees domain walls stripe occurs. At intermediate thicknesses, 71 degrees and 109 degrees domain walls coexist together with non-ferroelastic 180 degrees domain walls. TEM cross-section images show complex domain structure due to the interplay between electrostatic constrains imposed by the SrRuO3 electrode and mechanical constrains imposed by the DyScO3 substrate.

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Type
research article
DOI
10.1080/00150193.2015.1012414
Web of Science ID

WOS:000357364500001

Author(s)
Crassous, A.
Sluka, T.  
Sandu, C. S.
Setter, N.  
Date Issued

2015

Publisher

Taylor & Francis

Published in
Ferroelectrics
Volume

480

Issue

1

Start page

41

End page

48

Subjects

thin film

•

BiFeO3

•

domain structure

•

PFM

•

PLD

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LC  
Available on Infoscience
September 28, 2015
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/119384
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