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  4. First-principles study of microscopic models of the Si(001)-SiO2 interface.
 
conference paper

First-principles study of microscopic models of the Si(001)-SiO2 interface.

Pasquarello, Alfredo  orcid-logo
•
Hybertsen, M. S.
•
Car, R.
1995
Proceedings of the 22nd International Conference on the Physics of Semiconductors
22nd International Conference on the Physics of Semiconductors
  • Details
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Type
conference paper
Author(s)
Pasquarello, Alfredo  orcid-logo
Hybertsen, M. S.
Car, R.
Date Issued

1995

Publisher

World Scientific

Publisher place

Singapore

Published in
Proceedings of the 22nd International Conference on the Physics of Semiconductors
ISBN of the book

981-02-2978-X

Volume

1

Start page

612

End page

615

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CSEA  
Event name
22nd International Conference on the Physics of Semiconductors
Available on Infoscience
October 14, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/43703
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