Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process

conference paper

Veerappan, C.

•

Richardson, J.

•

Walker, R.

2011

Proc. IEEE European Solid-State Electron Device Conference (ESSDERC)

Name

charbon11essderc.pdf

Access type

openaccess

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472.53 KB

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Adobe PDF

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