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  4. Temperature dependence of the dielectric tunability of pyrochlore bismuth zinc niobate thin films
 
research article

Temperature dependence of the dielectric tunability of pyrochlore bismuth zinc niobate thin films

Tagantsev, A. K.  
•
Lu, J. W.
•
Stemmer, S.
2005
Applied Physics Letters

The change in permittivity of bismuth zinc niobate (BZN) films with the cubic pyrochlore structure under an applied electric field was measured as a function of temperature. Dielectric measurements were performed using parallel-plate capacitor structures with Pt electrodes on sapphire substrates. The electric field tunability of the permittivity was weakly temperature dependent and increased with decreasing temperature up to the onset of dielectric relaxation. At temperatures below the onset of the dielectric relaxation (similar to150 K at 1 MHz), larger electric fields were required to achieve the highest tunabilities. A simple model of hopping, noninteracting dipoles was not suited to describe. the dielectric tunability of BZN thin films. A better description of the experimentally observed behavior at temperatures above the onset of the dielectric relaxation was obtained using a simple random-field model with hopping dipoles in a uniform distribution of random fields. (C) 2005 American Institute of Physics.

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Type
research article
DOI
10.1063/1.1853533
Web of Science ID

WOS:000226864600056

Author(s)
Tagantsev, A. K.  
•
Lu, J. W.
•
Stemmer, S.
Date Issued

2005

Published in
Applied Physics Letters
Volume

86

Issue

3

Article Number

032901

Subjects

bi2o3-zno-nb2o5 cubic pyrochlore

•

relaxation

•

strain

Note

Tagantsev, AK Ecole Polytech Fed Lausanne, Lab Ceram, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Lab Ceram, CH-1015 Lausanne, Switzerland Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA

895LO

Cited References Count:15

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LC  
Available on Infoscience
August 21, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/233576
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