Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. Short X-ray pulses from third-generation light sources
 
research article

Short X-ray pulses from third-generation light sources

Stepanov, A. G.
•
Hauri, C. P.  
2016
Journal of Synchrotron Radiation

High-brightness X-ray radiation produced by third-generation synchrotron light sources (TGLS) has been used for numerous time-resolved investigations in many different scientific fields. The typical time duration of X-ray pulses delivered by these large-scale machines is about 50-100 ps. A growing number of time-resolved studies would benefit from X-ray pulses with two or three orders of magnitude shorter duration. Here, techniques explored in the past for shorter X-ray pulse emission at TGLS are reviewed and the perspective towards the realisation of picosecond and sub-picosecond X-ray pulses are discussed.

  • Details
  • Metrics
Type
research article
DOI
10.1107/S1600577515019281
Web of Science ID

WOS:000367548900019

Author(s)
Stepanov, A. G.
Hauri, C. P.  
Date Issued

2016

Publisher

International Union of Crystallography

Published in
Journal of Synchrotron Radiation
Volume

23

Issue

1

Start page

141

End page

151

Subjects

laser slicing

•

femtosecond X-ray pulses

•

picosecond X-ray pulses

•

X-ray pulse compression

•

X-ray switch

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
GR-HAU  
Available on Infoscience
February 10, 2016
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/123360
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés