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research article

Ultrafast Single-particle Imaging with Intense X-ray Pulses

Sun, Zhibin
•
Al Haddad, Andre
•
Augustin, Sven
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June 1, 2022
Chimia

Ultrafast single-particle imaging with intense x-ray pulses from free-electron laser sources provides a new approach for visualizing structure and dynamics on the nanoscale. After a short introduction to the novel free-electron laser sources and methods, we highlight selected applications and discuss how ultrafast imaging flourishes from method development to early applications in physics and biology to opportunities for chemical sciences.

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Type
research article
DOI
10.2533/chimia.2022.529
Web of Science ID

WOS:000823036400001

Author(s)
Sun, Zhibin
Al Haddad, Andre
Augustin, Sven
Knopp, Gregor
Knurr, Jonas
Schnorr, Kirsten
Bostedt, Christoph  
Date Issued

2022-06-01

Publisher

SWISS CHEMICAL SOC

Published in
Chimia
Volume

76

Issue

6

Start page

529

End page

537

Subjects

Chemistry, Multidisciplinary

•

Chemistry

•

ultrafast imaging

•

free-electron laser

•

x-ray

•

femtosecond

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

Available on Infoscience
August 1, 2022
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/189570
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