Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. Stable freestanding thin films of pure water
 
research article

Stable freestanding thin films of pure water

Weon, B. M.
•
Je, J. H.
•
Hwu, Y.
Show more
2008
Applied Physics Letters

Obtaining water microstructures is very difficult because of low viscosity and high surface tension. We produced stable freestanding thin films of pure water by x-ray bombardment of small liquid volumes in capillary tubes. A detailed characterization with phase-contrast radiology demonstrated a lifetime beyond 1 h with no chemical stabilizer for micron-thickness films with half-millimeter-level diameter. This can be attributed to the interplay of two x-ray effects: water evaporation and surface charging. (C) 2008 American Institute of Physics.

  • Details
  • Metrics
Type
research article
DOI
10.1063/1.2892078
Web of Science ID

WOS:000253989300163

Author(s)
Weon, B. M.
Je, J. H.
Hwu, Y.
Margaritondo, G.  
Date Issued

2008

Publisher

American Institute of Physics

Published in
Applied Physics Letters
Volume

92

Issue

10

Article Number

104101

Subjects

Disjoining Pressure

•

Emulsion Films

•

Foam

•

CIBM-PC

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPRX  
CIBM  
Available on Infoscience
November 30, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/61548
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés